SEM Microcharacterization of Semiconductors

SEM Microcharacterization of Semiconductors

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Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.GENERATOR COMPUTER leNS | | | - | ! l ENS ] PULSE- PHOTON-COUNTING len I D DELAY SYSTEM ELLIPTICAL - I miRROR La€“:= -:-l ... 8.9 Schematic diagram of a liquid helium CL SEM system for time-resolved studies. (After Bimberg etanbsp;...

Title:SEM Microcharacterization of Semiconductors
Author: D. B. Holt, D. C. Joy
Publisher:Academic Press - 2013-10-22

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